Author:admin

Date:2008-09-25T16:19:15.000000Z


git-svn-id: https://svn.eiffel.com/eiffel-org/trunk@44 abb3cda0-5349-4a8f-a601-0c33ac3a8c38

documentation/current/eiffelstudio/eiffelstudio-reference/metrics-tool/definitions/domains.wiki

@@ -25,7 +25,7 @@ After running the metric, you should see the following result in the Detailed Re
 
 [[Image:domain-example2|Metric detailed result]]  
 
-{{note|Note: an element can appear more than one time in a domain, but the detailed result list show only distinct items, so it is possible that the calculated metric value is not equal to the number of items in the detailed result list.}}
+{{note|an element can appear more than one time in a domain, but the detailed result list show only distinct items, so it is possible that the calculated metric value is not equal to the number of items in the detailed result list.}}
 
 
 A domain can be used as an argument of a relation criterion, see the following example:
@@ -52,10 +52,10 @@ And when this metric is calculated over input domain {<eiffel>APPLICATION</eiffe
 
 [[Image:domain-example6|Actual semantic for input domain item]]  
 
-{{note|Note: Only code element target, group, folder, class, feature, delayed item, input domain item and application target can be specified through domain selector in Metrics tool. And code element generic, assertion, argument, local, line cannot be specified in domain selector, but they may present in the detailed result domain list.}}
+{{note|Only code element target, group, folder, class, feature, delayed item, input domain item and application target can be specified through domain selector in Metrics tool. And code element generic, assertion, argument, local, line cannot be specified in domain selector, but they may present in the detailed result domain list.}}
 
 
-{{seealso| '''See Also''' <br/>
+{{seealso|<br/>
 [[Units|Units]]  <br/>
 [[Scopes|Scopes]]  }}
 

documentation/current/eiffelstudio/eiffelstudio-reference/metrics-tool/definitions/elementary-and-composite-metrics.wiki

@@ -25,7 +25,7 @@ By convention, this definition treats as process metric as a composite metric in
 
 The classification introduced for metrics extends to measures, so that we may talk about an elementary product measure, a composite process measure and so on.
 
-{{seealso| '''See Also''' <br/>
+{{seealso|<br/>
 [[Attributes, metrics and measures|Metrics]]  <br/>
 [[Scopes|Scopes]]  <br/>
 [[Domains|Domains]]  <br/>

documentation/current/eiffelstudio/eiffelstudio-reference/metrics-tool/definitions/metric-framework-and-theory.wiki

@@ -18,7 +18,7 @@ This note does not introduce a metric theory, but defines a metric framework by
 
 
 
-{{seealso| '''See Also''' <br/>
+{{seealso|<br/>
 [[Attributes, metrics and measures|Attributes, metrics and measures]]  }}
 
 

documentation/current/eiffelstudio/eiffelstudio-reference/metrics-tool/definitions/raw-metrics-and-selection-criteria.wiki

@@ -37,7 +37,7 @@ This criterion independence principle is not absolute, however, and in some case
 
 A metric is either elementary or composite. An elementary metric is either a raw metric, such as "number of features", or a derived metric obtained from slicing a raw metric by selection criteria. Composite metrics are obtained from existing metrics (elementary, or previously defined composite metrics) by applying some mathematical formula.
 
-{{seealso| '''See Also''' <br/>
+{{seealso|<br/>
 [[Elementary and composite metrics|Elementary metrics]]  <br/>
 [[Selection Criteria|Selection Criteria]]  <br/>
 [[Criterion References|Selection criterion reference]]  <br/>

documentation/current/eiffelstudio/eiffelstudio-reference/metrics-tool/definitions/selection-criteria.wiki

@@ -111,7 +111,7 @@ There are three criterion connectors: and, or, not. They are self-explanatory. J
 
 [[Image:selection-cri8|Relation criterion]]  
 
-{{seealso| '''See Also''' <br/>
+{{seealso|<br/>
 [[Domains|Domains]]  <br/>
 [[Criterion References|Selection criterion reference]]  }}