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Date:2008-09-17T13:53:28.000000Z git-svn-id: https://svn.eiffel.com/eiffel-org/trunk@3 abb3cda0-5349-4a8f-a601-0c33ac3a8c38
20 lines
788 B
Plaintext
20 lines
788 B
Plaintext
[[Property:title|Definitions]]
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* [[Definitions: Introduction|Introduction]]
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* [[Attributes, metrics and measures|Attributes, metrics and measures]]
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* [[Units|Units]]
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* [[Metric framework and theory|Metric frame work theory]]
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* [[Elementary and composite metrics|Elementary and composite metrics]]
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* [[Raw metrics and selection criteria|Raw metrics and selection criteria]]
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* [[Selection Criteria|Selection Criterion]]
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* [[Predefined raw metrics|Predefined raw metrics and predefined selection criteria]]
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* [[Scopes|Scopes]]
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* [[Domains|Domains]]
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* [[Measurement archive|Measurement archives]]
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* [[Under the Hood - How metrics work|Under the Hood - How Metrics Work]]
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* [[Criterion References|Selection Criteria Reference]]
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